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Course Description



Quality labelled course   

Characterization and Modification of Micro- and Nano-structures


Date: from 15 Dec 2003 to 16 Dec 2003

Duration 2 day(s)

Language English    Venue Neuchâtel, Switzerland

Country 

Course fee 560,00    Currency EURO    Discount 20% for students and PhD

Description
This is a 1.5 days course.
Characterization of small structures (imaging and analysis) is an enabling technology and as such essential for doing effective research/development on micro- and nano-structures. Understanding and/or optimising the functioning of a small device, a new material or a new system means control of matter at atomic and molecular scale. This is only possible if these structures are made visible and/or analysed, providing eg. compositional, magnetic, electrical or crystalline information from the specimen.
Many analytical techniques have shown major progress in the last decade and are supporting the worldwide efforts on research and development on micro-and nano-systems.

The course will cover all major microscopy imaging and analytical techniques with special emphasis on electron microscopy and focused ion beam systems. Per technique it is described which information is provided in terms of resolution, information depth, information volume, compositional information, structural information etc. Per technique specific requirements on the specimen and its preparation will be described such as size, amount needed, vacuum compatibility etc. This overview will allow the attendee to judge what today’s modern microscopy techniques can offer and which technique will be the best candidate for solving his/her next application problem, related to the information requirements and the nature of the specimen.

Course Contents and Time Table
Microscopy fundamentals:
Resolution-wavelength relationship; electron-specimen interaction; ion-specimen interaction
Microscopy overview:
Light microscopy, con-focal microscopy, scanning electron microscopy, transmission electron microscopy, focused ion beam systems, scanning probe microscopy, x-ray analysis, diffraction techniques
Other:
Overview of applications from all industries, commercial aspects of analytical equipment/tools, overview of suppliers

It is suggested that all course participants provide a short description of their background prior to the course in order to optimise the course content (eg application examples) towards the audience.

Audience
The course is essential for R+D department managers and for R+D project leaders from all industries and research organisations, involved in nano-science and nano-technology.
The course is attractive to marketing and business development managers as well as for engineers from various industries and research organisations.

Lecturers
Dr. Bernd Volbert, Namitec, The Netherlands

Further information
Annette Locher,
FSRM, Swiss Foundation for Research in Microtechnology, Neuchâtel (CH),
e-mail: locher@fsrm.ch
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