Course Description

Duration 1 day(s)

Language English    Venue Neuchâtel, Switzerland

Country 

Course fee 390,00    Currency EURO    Discount 20% for students and PhD

Description
Since atomic force microscope (AFM) was invented by Binning and Quate in 1986, it is now widely used for imaging surface structures of materials at ranging from micrometer to atomic scales. Spatial resolution of AFM is generally determined by geometry and material properties of the cantilever sensor, i.e., sharpness of the tip and spring constant of the cantilever. Sharper tip can resolve nano-scale surface features with better lateral resolution, while vertical resolution is prejudiced by elasticity of the cantilever. Cantilevers are also as an central devices to explore the physics and chemistry of the nanometer world. A thin flexible beam made of silicon or silicon nitride coated with a sensor layer serves as a ultra sensitive chemical or biological sensor. Moreover, the AFM can also be operated in liquid and he cantilever-AFM technique is used now to characterize surface topographies of biological samples. The potential uses of cantilever transducers as biosensors or in biomicroelectromechanical systems will be presented. The cantilever physics and required AFM technologies will be discussed in the context of potential future analytical applications and markets.

Course Contents and Time Table
# Introduction to AFM Principles
# Basics of Cantilever and Tip Technology
# Cantilever Production Technologies (Passive cantilevers, Self sensing cantilevers, Self actuated cantilevers, High speed AFM cantilevers)
# Potential Future Applications
# Market Outlook

Audience
The course addresses a AFM-technologically interested audience coming from industry as well as from universities.

Lecturers
Dr Ing. habil. Iwo W. Rangelow - Institute for Microsystem Technology and Analysis, University Kassel, Germany.

Further information
Annette Locher,
FSRM, Swiss Foundation for Research in Microtechnology, Neuchâtel (CH),
e-mail: locher@fsrm.ch