Course Description

Duration 3 day(s)

Language French or english    Venue CEA / INSTN , INP, Grenoble

Country France

Description
The objectives are:
- to know and use the principles and techniques of X-Ray Reflectometry and powder Grazing Incidence Diffraction for characterisation of thin layers.
- to choose the most suitable operating conditions depending on the material studied.

Course Contents and Time Table
Content:
1) X-ray diffraction in grazing incidence/ cristallography and radiocristallography: reminder of general principles/Phase analysis: reminder of general principles/ Thin layers and multilayers: specificities of X-ray diffraction/ calculation of penetration depth of X- ray/Interest of using grazing incidence or Bragg-Brentano geometry/effects of constraint and preferred orientation in grazing incidence of thin layers.

2)X-Ray Reflectometry: X-ray scattering inside and outside the specular direction/ Experimental configurations.

Group limited to 8 participants

Audience
Audience:

Research engineers, laboratory technicians,either beginner or with short experience of characterisation of materials by X-ray.


Lecturers
Lecturers are experienced experts and researchers working in the Research Center "Atomic Energy Commission" (Commissariat énergie atomique CEA), Grenoble, France.


Further information
Ms Joelle Andrieu, tel. +33 4 38 78 48 65 Fax. + 33 4 38 78 51 01 Mail to: instn.grenoble@cea.fr
www-instn.cea.fr/